4. ComponentsΒΆ
- 4.1. Main Application
- 4.2. ADC Calibration and Compensation
- 4.3. State Machine
- 4.4. Field-Oriented Control (FOC)
- 4.5. Test Harness
- 4.5.1. Overview
- 4.5.2. Accretive Testing
- 4.5.3. Test Harness Parameters
- 4.5.4. Test Guarding
- 4.5.5. Test Harness Architecture
- 4.5.6. Test harness modes
- 4.5.7. Interaction with the System State Machine
- 4.5.8. Forcing System State Machine Transitions
- 4.5.9. Test Harness Switches (Overrides)
- 4.5.10. Perturbation Signals
- 4.5.11. Seizures
- 4.5.12. Stack overflow
- 4.5.13. Profiling Timestamps
- 4.5.14. Example use cases
- 4.5.15. Implementation Notes
- 4.6. Supervisory Algorithms
- 4.7. External Interface
- 4.8. Diagnostic Kernel
- 4.9. Hardware Abstraction Layer (HAL)
- 4.10. Motion Control API (MCAPI)
- 4.11. Miscellaneous